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Explorer
Flexibility and Modularity without limits
Thanks to its modularity and the wide range of accessories and attachments available, Explorer allows to perform measurement in different configurations:
- X-Ray Powder Diffraction (XPD)
- Reflectometry (XRR)
- Grazing Incidence X-Ray Diffraction (GIXRD)
- High Resolution X-Ray Diffraction (HRXRD)
- Total X-Ray Fluorescence (TXRF)
- Residual Stress and Texture X-Ray Diffraction.
The modularity and the flexibility of the Explorer equipment allows to start with an entry-level system which can be upgraded to meet new end user requirements. GNR could supply a wide range of X-ray sources, optics, sample holders, detectors and configurations to satisfy several analytical needs.
With no limits to its applications, Explorer modular system offers high performances in all analytical areas, ranging from phases quantification of mixtures, to the determination of microstructural properties as residual stress and preferred orientation of crystallites on bulk materials as well as on thin films.
- Routine Cystalline phase identification and quantification
- Crystallite size – lattice strain and crystallinity calculation
- Polymorph screening and crystal structure analysis
- Residual Stress and Retained Austenite Quantification
- Thin Films, Depth Profiling and non ambient analysis
- Phase Transition monitorin, tecture and preferred orientations
The optics permit switches between Bragg-Brentano, focusing and parallel beam geometry using Johansson or parabolic mirror monochromators.
The high resolution reflectometry studies can be performed with EXPLORER to characterise layer thickness (from 1 to 500 nm with an accuracy better than 1%), density (with an accuracy better than ± 0.03 g/cm3), surface and interface roughness (from 0 to 5 nm with an accuracy better than ± 0.1 nm).
Measurements at low angles and a thin film attachment for parallel beam geometry allow the study of thin films and multilayers.
The coupling between a parabolic mirror monochromator and a channel-cut crystal mounted on the incident beam allows to realise a monochromatic parallel beam with high intensity and low divergence, suitable for high resolution measurements.
X-Ray Generator
- Maximum Output Power: 3 kW
- Max Output voltage: 60 kV
- Max Output current: 60 mA
- Voltage Step width: 0.1 kV
- Current Step width: 0.1 mA
X-Ray Tube
- Glass (option ceramic), Cu anode (option: Co, Fe, Cr, Mo, W, Ag) 0.4 x 12 mm LFF (Long Fine Focus) (options: 0.4 x 8 mm FF; 1×10 mm NF)
Goniometer
- Configuration: Vertical Theta/Theta geometry
- Measuring circle diameters: from 400 to 600 mm
- Angular Range: – 110° < 2 Theta < + 168° (according to accessories)
- Angle positioning: Direct drive torque motors with optical encoders
- Smallest selectable stepsize: 0.0001°
- Angular accuracy: Better than ± 0.01° over the whole 2-Theta range
Detector
- 1D/2D detectors
- Silicon Drift Detectors (SDDs)
Case
- External Dimensions: width 1427 mm, height 1976 mm, depth 1080 mm
- Weight: 605 kg
Processing Unit
- Computer Type: Personal Computer, the latest version
- Items controlled: X-ray generator, goniometer, sample holder, detector, counting chain
Software Informations
Data Collection Programs
GNR offers a large variety of acquisition programs, for standard as well as for customized hardware configurations. the list includes programs for powder and high resolution diffractometers, retained austenite, data acquisition of stress (plane and triaxial) and thin films (XRD and GIXRD).
SAX
Single peak analysis; peak treatment. Background subtraction, smoothing, deconvolution and peak localisation. Structural Analysis, Crystallite Size, Lattice Strain, Reflectometry, Quantitative Analysis.
Search and Match: MATCH!
Rietveld refinement, Display and compare multiple diffraction partners, Directly view specific phases/entries, instant usage of additional information, saving of selection criteria, Comfortable definition of background, Improved zooming facilities, Batch processing and Automatics.
Quality control
in metal analysis using OES/RDE
Material properties
control using XRD/TXRF
100%
Made in Italy
F.A.Q.
Even the most reliable equipment from ELVATECH may require service or repair. However, you need not worry as ELVATECH CANADA LTD. offers warranty and post-warranty service for spectrometers and analyzers at our company’s service center in Edmonton as well as at our authorized service center.
At Elvatech, our service concept is not centered around generating income but rather is a loyalty program for our customers. We offer fast, efficient, and non-profit maintenance and repair for our spectrometers. This approach significantly reduces the cost of using our spectrometers and analyzers and provides maximum convenience for our customers.
ELVATECH CANADA sells, rents, repairs, and provides service for XRF spectrometers and analyzers to customers all across Canada. Delivery is carried out by courier services directly from our head office in Edmonton based on CPT, Incoterms 2020.
Delivery time can vary from 1 to 12 weeks depending on the type of spectrometer, installed modes and calibrations, as well as availability of instruments in our stock.
Equipment is usually shipped after 100% payment is received to our bank account. Individual payment terms are provided for regular partners and dealers.